 การประชุมวิชาการระดับชาติ ครั้งที่ 16
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| Title | Evaluation of Sweet Corn Lines for Resistance to Northern Corn Leaf Blight Disease Caused by Exserohilum turcicum |
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| Other Titles: | ประเมินความต้านทานของสายพันธุ์ข้าวโพดหวานต่อเชื้อรา Exserohilum turcicum สาเหตุโรคใบไหม้แผลใหญ่ |
| Authors EN |
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| Authors TH |
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| Keywords | Sweet corn,Northern Corn Leaf Blight,Breeding,Resistance |
| Issue Date | 13-Aug-2024 |
| Publisher | The 16th NPRU National Academic Conference Nakhon Pathom Rajabhat University |
| Abstract | Reaction of 36 sweet corn varieties/lines to northern corn leaf blight disease (NCLB) were examined at Chiang Mai Field Crops Research Center in dry season, 2023. A randomized complete block design with two replicates was deployed. Fungi was cultured by dropping over the outside row and then left the disease to spread naturally. Results have found that at 28 days after plantation, it was found that all sweet corn line were moderately resistant to disease and showed disease rate between 11.2 – 17.0 percent of leaf area infected, compared to 10 commercial sweet corn varieties; Hibrix-3, Hibrix-59, Hibrix-72, Dr.Pex Wan 56, Dr.Pex Wan 1351, Dr.Pex Wan 1796, Sugar 75, Insee 2, Songkhla 84-1 and Chai Nat 2 were moderately resistant to disease and showed disease rate between 14.6 – 21.2 percent of leaf area infected. In addition, the results have found that at 55 days after plantation, all sweet corn lines, were moderately susceptible to disease and showed disease rate between 40.9 – 61.1 percent of leaf area infected, compared to 10 commercial sweet corn varieties were moderately susceptible to disease with disease rate between 44.9 – 67.8 percent of leaf area infected. However, the experimental results can select two sweet corns lines that have NCLB disease resistance levels higher than commercial varieties, which are CH66C1)-9-311211/HX75C1)-17-221111 and CH66C1)-9-311211/HX75C1)-8-122111, with disease rates of 40.9 and 44.4 percent of leaf area, respectively. These can be used in breeding programs for disease resistance. |
| ISBN | 978-974-7063-46-2 |
| URI | https://rdi.npru.ac.th/conference16 |